Device for measuring the periphery of an object
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United States of America Patent
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Sep 13, 1988
Grant Date -
N/A
app pub date -
Oct 13, 1987
filing date -
Oct 13, 1987
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A device for measuring the periphery of the kinescope panels of various sizes includes an elongated measuring member for each panel size. A gauge is associated with each elongated measuring member and is set to zero to get an optimum peripheral measurement. The elongated measuring member is tensioned about the panel and the gauge reading is the difference between the actual panel periphery and the optimum panel periphery.
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