Apparatus and process for measuring physical parameters of sheet material
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United States of America Patent
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Aug 23, 1988
Grant Date -
N/A
app pub date -
Jul 14, 1986
filing date -
Jul 14, 1986
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An apparatus and process for measuring physical parameters of sheet material via infrared absorption phenomena is disclosed. The invention employs an integral filter-detector package comprising at least two optical filter-detector combinations. The package is contained within a conventional sensor housing which traverses back and forth across the sheet material. The package may comprise an additional filter-detector combination that is selected to produce a detector response having a significantly higher signal-to-noise ratio than the response of remaining detectors. The former response is used in combination with synchronous detectors to provide a reference of the general shape and phase of the latter responses in the absence of high noise.
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