Apparatus for measuring the thickness profile of rolled strips
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jul 19, 1988
Grant Date -
N/A
app pub date -
Aug 20, 1986
filing date -
Aug 23, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
To determine the thickness profile of rolled metal sheets by measuring the absorption of X-rays a slit diaphragm is used which is rotatable about the imaginary center axis of the X-ray tube, the rotation consisting of a reciprocating movement lying in a range of less than 36.degree.. Between the reversal points of the rotation the rotational movement takes place in steps with rest intervals lying therebetween.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully