Analyzing probe
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United States of America Patent
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Mar 22, 1988
Issued Date -
N/A
app pub date -
Jan 13, 1987
filing date -
Oct 27, 1983
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The present invention briefly refers to a device and a method for analyzing samples of molten charges inside the charges themselves. An analyzing probe (1) comprising a body (4) of ceramic material with an inlet for molten charge is provided in a tube (5) of board or the like and forms a disposable probe. A cavity (2a) is provided in the ceramic body (4) and the inlet (3) has a notch or the like towards the cavity for receiving molten charge. An electrode (10) is positioned in the cavity (2a) and upon application of electric current via the electrode (10) and the molten charge a spark or a luminous arc is ignited between the electrode (10) and the portion of the sample of the molten charge adjacent the notch. A light-conducting body (8) is provided in the cavity adjacent the luminous arc or sparks for collecting light emitting therefrom.
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