Atomic absorption spectrophotometer

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United States of America Patent

PATENT NO 4728189
SERIAL NO

07006170

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Abstract

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An absorption profile indicative of a relation in atomic absorption spectroscopy between the absorbance of a desired element and time has a constant half-width independent of the concentration of the desired element in a sample, and hence the half-width of absorption profile with respect to the desired element can be previously determined from data which is obtained by the measurement of a standard sample. In an atomic absorption spectrophotometer herein disclosed, the half-width of absorption profile is previously determined in the above-mentioned manner, and the true peak value of an absorption profile obtained by measuring a sample which contains the desired element at a high concentration, is calculated using the time width of this absorption profile at a predetermined absorbance and the previously-determined half-width.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTD A CORP OF JAPAN6 KANDA SURUGADAI 4-CHOME CHIYODA-KU TOKYO
HITACHI INSTRUMENT ENGINEERING CO LTD A CORP OF JAPAN882 ICHIGE KATSUTA-SHI IBARAKI-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hashimoto, Masao Katsuta, JP 36 432
Kamitake, Seigo Katsuta, JP 1 1
Oishi, Konosuke Mito, JP 16 136
Uchino, Koichi Katsuta, JP 5 58
Yamada, Hideo Katsuta, JP 80 1094

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