Apparatus for measuring characteristics of electronic devices
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United States of America Patent
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Feb 23, 1988
Grant Date -
N/A
app pub date -
Sep 27, 1985
filing date -
Oct 4, 1984
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An electronic device measurement apparatus measures a characteristic of an electronic device under test (DUT) by applying a sine-wave voltage to the DUT, detecting the voltage across the DUT as well as the current flowing through the DUT and displaying a characteristic curve in accordance with the detected voltage and current. The sine-wave voltage is generated in phase with an AC line voltage but the amplitude thereof is independent of the line voltage, and consequently the circuits in the measurement apparatus are not affected by variations in phase and amplitude in the line. Moreover, the generated sine-wave voltage is symmetrical, whereby display distortion is substantially eliminated. A voltage limiter and a current limiter are provided for limiting the voltage and current to be applied to the DUT to values determined by a display window, for protecting a current detecting resistor and a voltage divider connected to the DUT.
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