X-ray dispersive and reflective structures
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United States of America Patent
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Feb 23, 1988
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N/A
app pub date -
Jun 18, 1986
filing date -
Jun 6, 1983
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Abstract
X-ray dispersive and reflective structures and materials are provided which exhibit at least one third of the theoretical integral reflection coefficient for the structures in the range of interest without fluorescence or absorption edges. The materials can be thermally activated to control the desired properties, during or post deposition. The structures can be deposited by ion beam absorption techniques to form the structures in a precise manner. The index of the refraction of the structures can be continuously varying throughout the structures.
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