Method and apparaus for centrally collecting measured values
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United States of America Patent
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Jan 19, 1988
Grant Date -
N/A
app pub date -
Mar 29, 1985
filing date -
Mar 31, 1984
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method and apparatus to centrally collect measured values of a variable parameter from each of a plurality of work stations, and so as to facilitate quality control. Each work stations includes a sensor for generating an output signal which is a function of the variable parameter, and the output signal is converted to digital signals, which represent discrete increments within the measuring range of the variable parameter. The digital signals are stored during a predetermined period of time in a memory unit so as to be available for periodic scanning by the central computer, after which the stored signals are cleared so that the memory unit is free to record the values during the next period of time. Also, circuitry is provided whereby only the extreme values of the output signalsd ar stored, together with the mean value, which are adequate to provide a complete statement of the quality of the process and product being monitored.
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