Method of measuring the temperature of a photocathode
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United States of America Patent
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Nov 24, 1987
Grant Date -
N/A
app pub date -
Dec 27, 1985
filing date -
Dec 27, 1985
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A method of determing the actual temperature of a layer of an infrared material, especially during heat cleaning, which includes measuring the thickness of the layer and the amount of radiation being emitted from it. An apparent temperature corresponding to a desired actual temperature is found from a curve of apparent temperature, which are derived from the radiation amount, versus thickness. The apparent temperature which corresponds to the desired actual temperature compensates for interference effects on the radiation measurement. A computer may be utilized to calculated the apparent temperature which corresponds to the desired actual temperature and to regulate and maintain the infrared material at the apparent temperature.
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