Contact for multicontact probe assembly
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United States of America Patent
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-
Nov 17, 1987
Grant Date -
N/A
app pub date -
Jun 11, 1985
filing date -
Jun 12, 1984
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A contact for a multicontact probe assembly for testing at least partially conductive elements has a conductive contact rod extending along a axis and having a rear end and a forwardly directed and pointed front test end of construction suitable for using alone as a test point. A respective conductive cap engageable axially snugly over the pointed front end of the rod can be releasably secured on the pointed front end for use of the same rod to test, for example, a bushing or a bore connection. Thus a single contact can serve several functions, making the probe assembly having it much more versatile than prior-art systems. Only some of the contact rods of a probe assembly, those destined to engage large-diameter bores or bushings, need be equipped with the heads, and the small pointed tips of the remaining rods of the assembly can engage and contact the strips or smaller holes or bushings directly.
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