Apparatus for testing and sorting oblong, electronic components, more particularly integrated chips
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United States of America Patent
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-
Nov 3, 1987
Issued Date -
N/A
app pub date -
Oct 21, 1986
filing date -
Jan 2, 1986
priority date (Note) -
Expired
status (Latency Note)
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Abstract
In the case of an apparatus for testing and sorting oblong, electronic components, more particularly integrated chips, the components, which have been supplied in a row, are separated by means of a separating arrangement. The separating arrangement consists of a belt conveyer, which is arranged above a slideway for the components which have been supplied and which takes hold of the components which have been supplied and pushes them forward on the slideway. A control signal, which is emitted by a detecting arrangement which is arranged after the separating arrangement, is used for the purpose of stopping the belt conveyer so that the component, which has just been delivered by the belt conveyer, can, in the first instance, be tested. After testing has taken place, the belt conveyer is set in operation again.
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