Logic analyzer

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United States of America Patent

PATENT NO 4701918
SERIAL NO

06737467

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Abstract

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A logic analyzer applies test pattern signals from a pattern generator to a circuit under test and sequentially reads logic outputs into a memory. The output from the circuit under test when it reaches a predetermined logic state is input as an external control signal into the logic analyzer. A change command is generated from the pattern generator in relation to the generation of the test pattern signal. When the change command and the external control signal are obtained at the same time, and flow of the generation of the test pattern signals is changed to a predetermined flow.

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Patent Owner(s)

Patent OwnerAddress
TAKEDA RIKEN KOGYO KABUSHIKIKAISHA32-1 ASAHI-CHO 1-CHOME A CORP OF JAPAN NERIMA-KU TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akiyama, Noboru Kumagaya, JP 77 1467
Aoki, Tetsuo Kohnosu, JP 9 278
Kobayashi, Katsumi Gyoda, JP 171 1469
Nakajima, Takayuki Gyoda, JP 86 1414

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