Method of measurement using scattered light

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United States of America Patent

PATENT NO 4697925
SERIAL NO

06665623

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Abstract

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The test solution in the measuring cell is regarded to be divided into a plurality of sections, and the quantity of scattered light from each section is continuously measured to give a plurality of independent series of signal. This measurement is carried out by scanning the measuring cell with a minute light flux periodically to obtain a plurality of measurements in a period. Out of the series of signals obtained, those containing abnormal scattered light signal are eliminated to determine accurate concentration and reaction process.

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Patent Owner(s)

Patent OwnerAddress
KABUSHIKI KAISHA KYOTO DAIICHI57 NISHIAKETA-CHO HIGASHIKUJO MINAMI-KU A CORP OF JAPAN KYOTO-SHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hyodo, Hiroshi Kyoto, JP 14 1674
Iwase, Kenichi Joyo, JP 3 81
Kishimoto, Shinichi Kuze, JP 44 290
Yamada, Naoki Joyo, JP 428 4961

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