Electrical test apparatus
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United States of America Patent
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Aug 11, 1987
Grant Date -
N/A
app pub date -
Dec 24, 1984
filing date -
Dec 24, 1984
priority date (Note) -
Expired
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Abstract
A test apparatus for testing such electrical circuit elements as components of printed circuit boards or integrated circuit chips includes a number of substantially indentical pin modules or units, one for each pin under test. The several modules are separately programmed by a CPU to provide a suitable state at the pin under test, i.e., excitation signal, read signal or impedance. Power to the unit under test is provided by the pin module.
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