Probe assembly for circuit-board tester
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United States of America Patent
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Aug 11, 1987
Grant Date -
N/A
app pub date -
Jun 11, 1985
filing date -
Jun 12, 1984
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A probe assembly for testing at least partially conductive elements has a dielectric base plate, a plurality of conductive supports on the base plate generally insulated from each other thereby, and each having a forwardly open socket having a forwardly concave socket surface, and a plurality of conductive contact rods, each having a substantially part-spherical rear ball end having an outer surface, and resting in a respective one of the sockets, and a forwardly directed front test end. According to the invention one of the surfaces is formed with at least one edge engaging only in line contact with the other surface. Thus, when the tips are engaged with conductive regions of an element to be tested, electrical connection can be made at the region of line contact between the contact rod and support.
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