Integrated circuit test clip
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United States of America Patent
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Jul 28, 1987
Grant Date -
N/A
app pub date -
Oct 28, 1985
filing date -
Oct 30, 1984
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The present invention relates to a connection system between an integrated circuit, encapsulated in a 'chip carrier with perimetric connections' or ceramic 'MICOP', and the dynamic testing devices (for example between a microprocessor and a logic analyzer). This system of connection is a test chip which is formed of an insulating body comprising at its periphery a number of test contacts equal to the number of inputs-outputs of the MICOP installed or not in its connector. Locking levers pivotably mounted to the body provide locking of the test clip. Finally, a printed circuit fixed to the insulating body allows wiring of the connection cable to the test clip.
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