Method and apparatus for rapidly testing capacitors and dielectric materials
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United States of America Patent
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Jul 28, 1987
Grant Date -
N/A
app pub date -
May 10, 1985
filing date -
May 10, 1984
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The apparatus comprises a measuring unit (300) which receives a component to be tested (Cx) in series with a reference impedance in a measuring chain, a clock (100) suitable for applying repetitive stimulating pulses to the measuring chain, means for resetting the voltage at the terminals of the reference impedance to zero during each inactive half-cycle of the stimulating pulses, sampling means (400) which sample the response at instants which are progressively shifted relative to the stimulating pulses, and a processing unit (200) which analyzes the samples taken by the sampling unit to deduce the parameters of the tested item using a Foster model.
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