Method of making a trench capacitor and dram memory cell

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United States of America Patent

PATENT NO 4679300
SERIAL NO

06785195

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Abstract

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A method of making a trench capacitor employs an N-type switchable plate formed in a P-type substrate for holding charge at either zero volts or a positive TC voltage and a P-type ground plate that fills in a trench around a memory cell, so that P-type dopant diffuses through a thin oxide insulator to form a channel stop and a pinhold short through the oxide is self-healing by the formation of a reverse-biased P-N diode that cuts off the flow of current through the pinhole.

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Patent Owner(s)

Patent OwnerAddress
SGS-THOMSON MICROELECTRONICS INC1310 ELECTRONICS DRIVE CARROLLTON TX 75006

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chan, Tsiu C Carrollton, TX 62 1306
Han, Yu-Pin Dallas, TX 25 702

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