LSI fault insertion
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 26, 1987
Grant Date -
N/A
app pub date -
Feb 4, 1986
filing date -
Feb 4, 1986
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Apparatus and method for providing programmable fault insertion circuitry in a large scale integrated (LSI) circuit device thereby eliminating the need for external switches or relays to create faults. A fault parameter word is stored in a register and the outputs of the register are decoded to select the fault condition to be inserted by an interfacing circuit to the logic being tested. Test vectors and the fault parameter word are generated by a controller coupled to the integrated circuit and a test response from the integrated circuit is examined by the controller.
First Claim
Family
International Classification(s)
- [Classification Symbol]
- [Patents Count]
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully