Tri-axis automated test system for printed circuit boards
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United States of America Patent
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-
Dec 2, 1986
Grant Date -
N/A
app pub date -
Feb 1, 1985
filing date -
Feb 1, 1985
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A computerized apparatus for performing functional and incircuit tests on complex printed circuit boards is disclosed. A printed circuit board under test is held in a vertical fixture and electrically coupled with the power circuit of a primary test unit. A limited bed of nails unit is interfaced with the vertical fixture holding the printed circuit board under test and the multiple spring contact probes of the limited bed of nails unit are maintained by spring pressure with predetermined terminals on the rear solder side of the printed circuit board under test. The limited bed of nails unit includes an etched printed circuit panel whose circuitry is connected with the spring probes of the unit through soldering. A precision tri-axis test prober assembly is placed rearwardly of the limited bed of nails unit and a computer-controlled test probe element is moved through clearance openings formed in a predetermined pattern through the limited bed of nails unit to make contact with the rear solder side of the printed circuit board under test at prescribed points to carry out the incircuit testing of the board under test. Functional testing of the board under test through the circuitry of the primary test unit is also enabled.
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