Method for adding impurities to semiconductor base material

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United States of America Patent

PATENT NO 4618381
SERIAL NO

06613778

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Abstract

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A method for adding impurities to a semiconductor base material comprises the steps of placing the base material in a vacuum chamber having an atmosphere containing the impurities as dopants, heating the base material to a temperature not exceeding 400.degree. C., and causing a glow discharge in the vacuum chamber. The impurities are introduced as a gas containing, for example, diboron, phosphine, antimony, arsenic, gallium, or as an organic metal gas such as trimethyl gallium, trimethyl indium, or trimethyl aluminum. To cause the dopant atoms to become substitutional by assuming lattice positions, the base material may be subjected to a second glow discharge in an inert gas atmosphere.

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Patent Owner(s)

Patent OwnerAddress
FUJI ELECTRIC COMPANY LTD A CORP OF JAPANNO 1-1 TANABESHINDEN KAWASAKI-KU KAWASAKI-SHI KANAGAWA
FUJI ELECTRIC CORPORATE RESEARCH AND DEVELOPMENT LTD A CORP OF JAPAN2-1 NAGASAKA 2-CHOME YOKOSUKA-SHI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ishiwate, Osamu Kanagawa, JP 1 20
Sato, Noritada Kanagawa, JP 20 162
Seki, Yasukazu Kanagawa, JP 23 339

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