Apparatus for measurement by digital spectrum analyzer
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United States of America Patent
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Aug 19, 1986
Grant Date -
N/A
app pub date -
Sep 25, 1984
filing date -
Sep 28, 1983
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A frequency range of measurement is divided into a plurality of regions. For each region a test signal suitable for measurement of the region is generated independently, and the test signal is supplied to a device under test. The output of the device under test is converted by an AD converter into a digital signal, which is then subjected to fast Fourier transform. For each region the sensitivity of the AD converter is set for optimal conversion of the signal level at its input side by the converter, and then the fast Fourier transform is carried out. On the basis of the sensitivity set for one of the regions, the magnitude of the fast Fourier transform output in each of the other regions is corrected according to the sensitivities set for the other regions.
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