Electrical probe contact
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United States of America Patent
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Jun 24, 1986
Grant Date -
N/A
app pub date -
Mar 6, 1984
filing date -
Mar 6, 1984
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An easy to manufacture, yet durable electrical probe contact is provided which is especially designed for connecting test equipment leads and patch cords to a variety of probe tips. The contact hereof includes a stamped and formed coupling portion that electrically and mechanically couples a wire lead to a screw machined or cold pressed probe tip. The manufacturing advantages inherent in stamped and formed contacts are thereby combined with the durability of screw machined and cold pressed tips. Moreover, the coupling portion is especially designed to receive a variety of tips, including the desirable banana plug type tip.
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