Logic circuit test system
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United States of America Patent
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Apr 15, 1986
Grant Date -
N/A
app pub date -
May 31, 1984
filing date -
May 31, 1983
priority date (Note) -
Expired
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Abstract
A test system for simultaneously testing a plurality of logic circuits first sets them all to an initial state before beginning testing. The faulty logic circuits which cannot be set to the initial state can be identified, and the testing of the others can proceed, even after only one cycle of attempting to initialize all the logic circuits. If all the logic circuits are faulty, the further testing can be prevented.
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