Electrical contact probe
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United States of America Patent
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-
Feb 18, 1986
Grant Date -
N/A
app pub date -
Sep 14, 1983
filing date -
Sep 14, 1983
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An electrical contact probe is produced by four passes of a profiled machining cutter across the longitudinal axis of the probe at circumferentially equidistantly spaced points and with the machining cutter on each pass traveling on a linear path disposed at an acute angle to the longitudinal axis of the probe. The contact probe so produced has a long pyramid center point surrounded concentrically by eight modified pyramid points in two levels or heights. The shortest level points are arranged in alternating relation with the other points surrounding the center point and all of the surrounding points are of lesser height than the center point.
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