Semiconductor device for automation of integrated photoarray characterization
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United States of America Patent
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Jan 28, 1986
Issued Date -
N/A
app pub date -
Feb 26, 1985
filing date -
Sep 8, 1981
priority date (Note) -
Expired
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Abstract
A semiconductor device structure is used to determine minority carrier lifetime and photosensitivity for production-processed integrated circuits and devices. The device structure family described herein permits determination of the minority carrier lifetime and photosensitivity at high throughput rates using automated test equipment in a normal test facility environment.
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