Method for calibrating a reflectometer containing black and white references displaced from the sample position
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United States of America Patent
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Jan 28, 1986
Grant Date -
N/A
app pub date -
Nov 10, 1983
filing date -
Nov 10, 1983
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Expired
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Abstract
A method is disclosed for calibrating a reflectometer using black and white references observed in locations optically different from the sample location. Dark and light standards are selected to have reflectance values, while examined in the detection location of the test elements, that are within .+-.0.005 and .+-.0.05 of the values of the black and white references, respectively, when examined in a location displaced from the detection location of the test elements. Such standards are then read on a referee reflectometer having 'ideal' black and white references, and the reflectances so read on the referee reflectometer are recorded for use as calibrating factors in making reflectance readings for the test elements.
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