Method of manufacturing a semiconductor device

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United States of America Patent

PATENT NO 4560642
SERIAL NO

06632239

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Abstract

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A method of manufacturing a semiconductor device which comprises the step of applying a silicon carbide film having a prescribed perforated pattern as a masking film selectively to etch a silicon dioxide film or diffuse an impurity into a substrate.

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Patent Owner(s)

Patent OwnerAddress
TOYKO SHIBAURA ELECTRIC CO LTDNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ajima, Takashi Tokyo, JP 14 358
Hiraki, Shunichi Yokohama, JP 19 687
Koshino, Yutaka Tokyo, JP 26 354
Oka, Yoshitami Kawasaki, JP 2 23
Yonezawa, Toshio Yokosuka, JP 55 971

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