Method and apparatus for handling charged particle beam

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United States of America Patent

PATENT NO 4554452
SERIAL NO

06514632

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Abstract

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In a method of and an apparatus for handling a charged particle beam, at least one of a signal representative of the astigmatism and a signal for correction of the astigmatism is obtained by computation on the basis of values detected under a certain condition from signal particles derived from an object which is moved repeatedly at least two directions with respect to a charged particle beam. The amount and direction of astigmatism thus computed are displayed respectively for manual correction. Astigmatism correction and focusing can be also carried out automatically.

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Patent Owner(s)

Patent OwnerAddress
ELIONIX INC3-7-6 MOTOYOKOYAMACHO HACHIOJI-SHI TOKYO 192-0063

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Suganuma, Tadao Hachiouji, JP 2 23

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