Method and apparatus for determining the penetration and leaching process of conductive phases
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United States of America Patent
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Nov 12, 1985
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N/A
app pub date -
Jun 30, 1982
filing date -
Oct 7, 1981
priority date (Note) -
Expired
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Abstract
Method for one-time or continuous nondestructive determination of the penetration and leaching process of conductive phases in materials, wherein the conductivity of the material to be examined is measured in thin superposed layers in that, after applying voltage to pairs of oppositely disposed conductor paths associated with these layers, the current flow through separate layers of the material is measured and an increase of the current in increasingly deep layers indicates the advance of the front of the penetrating phase.
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