Method and device for the sampling of trace elements in gases, liquids, solids or in surface layers
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United States of America Patent
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Sep 17, 1985
Grant Date -
N/A
app pub date -
May 20, 1983
filing date -
Sep 23, 1981
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The subject invention provides a method and apparatus for the sampling of trace elements in gas, liquids, solids or on surface layers. A collector surface having predetermined absorption characteristics is brought into contact with a material to be sampled. Thereafter, the collector surface is brought into contact with a contact membrane. The contact membrane is heated and swept by a carrier gas from the input head of an analysis apparatus to analyze the sample collected by the collector membrane. Trace elements in the sampling thermally desorbed by the collector surface are put in solution, are subject to diffusion and evaporation by traversing the contact member, and are transported by the carrier gas through a conduit to a gas analyzer for analysis. The use of both a collector surface cooperating with a contact member advantageously regenerates the collector surface so that it may be used in repeated sampling operations. The contact membrane is formed in a substantially regular geometric shape, preferably circular, so that it may be swept by the carrier case from its outer periphery to its center. The method and apparatus of the present invention provide enhancement sensitivity and speed in the analysis of trace elements to be detected.
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