Non-mass-analyzed ion implantation

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United States of America Patent

PATENT NO 4533831
SERIAL NO

06477375

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Abstract

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A non-mass-analyzed ion implantation process wherein two or more species of ions of the same polarity having greatly different ion masses are generated from a compound source material, the ions are accelerated under the application of an electric field, and the accelerated ions are scanned under the application of a magnetic field so as to be implanted into a target at a distribution profile which varies with the species of ions. An ion implantation apparatus can be simplified. A large ion beam current with a large spot size can be used and ions can be implanted to the target at a large dose within a short time. Especially, the non-mass-analyzed ion implantation is advantageously utilized for production of solar batteries.

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Patent OwnerAddress
NEW ENERGY DEVELOPMENT ORGANIZATIONNO 1-1 HIGASHI IKEBUKURO 3-CHOME TOSHIMA-KU TOKYO 170

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Itoh, Haruo Hino, JP 20 276
Saitoh, Tadashi Tokyo, JP 48 994
Tokiguchi, Katsumi Machida, JP 20 377
Tokuyama, Takashi Higashikurume, JP 26 306
Warabisako, Terunori Tokyo, JP 21 693

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