IC tester
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United States of America Patent
Stats
-
Jun 11, 1985
Grant Date -
N/A
app pub date -
Oct 21, 1982
filing date -
Oct 29, 1981
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An IC tester has a plurality of drivers for delivering test pattern signals through connector lines to corresponding terminal pins of an IC being tested. Outputs supplied from the IC being tested in response to the test pattern signals are delivered back through the connector lines to comparators coupled with output terminals of the drivers, respectively, so that the outputs from the IC can be determined as to their logic levels by the comparators. A plurality of low-pass filters are connected in series between the drivers and junctions between the comparators and the connector lines. Each of the low-pass filters has a ground terminal connected to ground through a switch which is controlled to be turned off at least when an output is supplied from the IC being tested. The low-pass filter has a cutoff frequency selected so that the test pattern signals will have desired rise and fall characteristics.
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