Ionization chamber for measuring the profile of a radiation field of electron or X-ray radiation
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United States of America Patent
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Apr 30, 1985
Grant Date -
N/A
app pub date -
Nov 17, 1983
filing date -
Nov 17, 1983
priority date (Note) -
Expired
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Abstract
An ionization chamber for measuring the profile of a radiation field is provided which comprises a first electrode and a second electrode arranged parallel to said first electrode, both electrodes forming a gap therebetween. A shield made of a material opaque to ions produced by the radiation field is movably arranged in said gap between said electrodes and has an aperture, which between said electrodes forms a measuring volume. The ionization chamber further comprises means for moving said shield together with said aperture along said gap between said electrodes.
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