Apparatus and method for measuring temperature profile
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Mar 5, 1985
Grant Date -
N/A
app pub date -
Nov 23, 1982
filing date -
Nov 25, 1981
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A camera contains a row of diodes sensitive to infrared radiation and mounted on a turntable for rotation about the optical axis of the camera. The signals from the diodes provide a temperature profile of a band across the width of a strip of hot rolled steel moving in a direction orthogonal to the optical axis and to the length of the row of diodes. Since the diodes are low accuracy devices, their measurements are compensated by normalizing co-efficients derived by comparison with the signal provided by an optical pyrometer viewing the central part of the steel strip in the region of the optical axis. To enable all diodes to be calibrated, calibration is effected with the turntable rotated 90.degree. to align all the diodes with the central part of the strip as viewed by the pyrometer. The camera may be mounted on one arm of a C-frame having X-ray tubes in an arm and X-ray detectors in the other arm for the purpose of measuring the thickness profile of the strip in known way. The compensated temperature measurements can then be used to correct the corresponding thickness measurements to take account of the variation in apparent thickness with density, and hence temperature.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully