IC Tester
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United States of America Patent
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-
Jan 29, 1985
Grant Date -
N/A
app pub date -
Aug 13, 1982
filing date -
Aug 19, 1981
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An IC tester supplies test pattern signal to an IC being tested and compares response signals therefrom with an expected-value pattern signal to determine whether the IC is acceptable or not. During the test, the IC being tested is severed by a separator means from the drivers, for producing the test pattern signals with a timing signal generator set in a condition for generating reference signals. The reference signals and the outputs from the drivers are compared for phase by a phase comparator means. Variable delay means inserted in the paths of the test pattern signal are adjusted by the result of the comparison to suppress skews between the paths of the test pattern signals. Skews in strobe signals, which serve to determine the logic levels of the response signals output from the IC being tested, are also suppressed.
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