Glitch detecting and measuring apparatus
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United States of America Patent
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-
Jan 22, 1985
Grant Date -
N/A
app pub date -
Dec 17, 1982
filing date -
Dec 21, 1981
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A device for recognizing and measuring the lengths of glitches by sampling the input signal at fractions of a sampling clock, which clock has a period shorter than the period of pulses of the correct signal but longer than the glitch widths. The corrected input signal can be displayed, along with the glitch information.
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