Dual axis inclination measuring apparatus and method
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United States of America Patent
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-
Dec 4, 1984
Grant Date -
N/A
app pub date -
May 24, 1982
filing date -
May 24, 1982
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A dual axis inclination measuring system includes a sensor unit for placement on a surface to determine the inclination of the surface with respect to two mutually perpendicular horizontal axes and an indicator unit connected to the sensor unit and operative to process signals generated by the sensor unit to determine and indicate the inclination of the test surface. The sensor unit includes a dual axis sensor element which cooperates with circuits for generating signals having voltage levels proportional to the inclination of the sensor. The indicator unit includes an analog-to-digital converter operative to convert the voltage levels to digital words and a digital computer operative to calculate angle readings from the digital words. The computer includes a look-up table of a plurality of the digital words stored in a memory of the computer and is calibrated exclusively to the particular sensor with which the computer is used, thereby providing great accuracy.
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