X-Ray examination apparatus

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United States of America Patent

PATENT NO 4472826
SERIAL NO

06468232

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Abstract

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In an X-ray examination apparatus comprising an image intensifier tube and an optical light distribution system there is included an image field selector, by means of which, using a subbeam diverted from the imaging beam, a measurement field can be selected and by means of which this measurement field or a boundary outline thereof can be projected back into the imaging radiation path. Thus, it is achieved that during an examination stage an indication of the extent and location of a measurement field which is considered to be relevant for controlling the desired exposure for pictures to be produced, can be constantly displayed on the image screen of the television monitor.

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Patent Owner(s)

Patent OwnerAddress
U S PHILIPS CORPORATION A CORP OF DE100 EAST 42ND ST NEW YORK NY 10017

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
van, de Ven Johannes T A Eindhoven, NL 7 60

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