Integrated circuit testing apparatus
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United States of America Patent
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May 22, 1984
Grant Date -
N/A
app pub date -
Apr 8, 1981
filing date -
Apr 8, 1981
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An integrated testing apparatus provides bidirectional coupling of a high voltage either from an internal source on an integrated circuit to a first external pin on the integrated circuit package, or to the output point of said internal source of high voltage from a voltage source external to the integrated circuit package that is coupled to said first external pin, said coupling occurring in response to an enabling signal externally impressed on a second external pin on said integrated circuit package. The testing apparatus is substantially transparent to normal integrated circuit operation when said enabling signal is removed from said second external pin.
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