Temperature sensing circuit for semiconductor junction temperature probe
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United States of America Patent
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Nov 29, 1983
Grant Date -
N/A
app pub date -
Jun 9, 1980
filing date -
Jun 9, 1980
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The temperature probe is biased for causing current flowing therethrough to be proportional to the probe temperature. A variable set point temperature is represented by a variable reference current which is summed with the temperature probe current. An output signal is produced therefrom to indicate the relationship between the set point temperature and the probe temperature.
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