Apparatus for measuring vapor density, gas temperature, and saturation ratio
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United States of America Patent
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Jul 19, 1983
Grant Date -
N/A
app pub date -
Jun 30, 1980
filing date -
Jun 30, 1980
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An apparatus for measuring vapor density and saturation ratio of individual chemical species in multi-component, multi-phase systems includes means to permit measurement in supersaturated vapor and in the presence of liquid, solid and dispersed aerosol phases of the sampled gas component and of other chemical species. Active narrowband differential measurements of broad band radiation passed through the sampled environment and then isolated to a plurality of narrow wavelength bands whose wavelength is related to the gaseous absorption spectra of the sampled species permit the measurement of vapor density of individual chemical components. A concurrent passive radiometric measurement of gas temperature in a strong absorption band of a relatively constant gaseous component enables the conversion of component vapor density to component saturation ratio even in the presence of component or system supersaturation.
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- 18 Citation Count
- G01J Class
- 0 % this patent is cited more than
- 42 Age