Ultrasonic test probe
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United States of America Patent
Stats
-
Jul 5, 1983
Grant Date -
N/A
app pub date -
Nov 10, 1980
filing date -
Dec 3, 1979
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
An ultrasonic test probe comprises a transducer and an electrical circuit, particularly means for generating the high voltage transmit pulse to the transducer, all disposed within the probe housing. The high voltage transmit pulse is produced by current flow through an electrical inductor. Other circuit components are also arranged within the probe housing.
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