Apparatus for testing, in-circuit, semiconductors shunted by a low resistance
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United States of America Patent
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May 31, 1983
Grant Date -
N/A
app pub date -
Sep 12, 1980
filing date -
Sep 12, 1980
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A signal source in the form of a 60 Hz voltage generator provides a 12 volt peak-to-peak signal to the primary winding of a transformer which has a secondary winding with upper and lower leads and a center tap lead. The voltage between the center tap lead and each of the upper and lower leads is 6 volts when the secondary winding is not loaded. A 5 ohm resistor is connected between the upper lead and ground, while the lower lead is connected to a first test lead. The other test lead is connected to ground. In operation, the test leads are placed across the junction of the semiconductor to be tested. The junction of the lower lead and the first test lead is connected to the input of a first amplifier, the output of which is applied to one of the horizontal deflection plates of an oscilloscope. The center tap lead is connected to the input of a second amplifier which has a variable gain and is designed such that in operation the peak output of the second amplifier is a selected magnitude, regardless of the peak voltage of the input signal, sufficient to provide substantially full vertical deflection on the oscilloscope when applied to one of the vertical deflection plates.
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