Probes for fixed point probe cards
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United States of America Patent
Stats
-
May 3, 1983
Issued Date -
N/A
app pub date -
Jul 21, 1975
filing date -
Jul 15, 1974
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
Probes for a probe card adapted to test integrated circuit patterns having contacts deployed thereon, the card including an opening providing access to a pattern and a ring of spaced conductive pads surrounding the opening. The probes are adapted to be anchored on selected pads of the card, each probe being constituted by a rigid, blade-like needle-holder having a deflectable needle extending therefrom to engage a respective contact in the pattern being tested.
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