Method of making an RF admittance measuring probe and product thereof
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United States of America Patent
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-
Jun 1, 1982
Issued Date -
N/A
app pub date -
Mar 21, 1979
filing date -
Nov 28, 1975
priority date (Note) -
Expired
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Abstract
An RF probe and method for making same including laminating sheets of thermoplastic insulation to both sides of a layer of wire screen which is evacuated and pressure thereafter applied by fluid pressure acting on a diaphragm pressing member.
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