Importance

Loading Importance Indicators...

Abstract

A vacuum test head has an easily changeable test pin programming plate for contacting a planar unit under test. A plurality of contact probes are mounted in a base. Each contact probe has a spring loaded first end located at, and urged away from, a first side of the base and a second end located at a second side of the base. A mounting member, mounted for reciprocal movement relative to the first side of the base, has an opening therethrough providing access to the first ends of the contact probes and a plate support facing away from the base. A programming plate has mounted therein a plurality of axially elongated and rigid test pins which are axially movable relative to the programming plate. The total number of test pins is less in number than the contact probes. Each test pin has a first end located on a first side of the programming plate and a second end located on a second side of the programming plate. The second end of each test pin is alignable with the first end of a different one of the contact probes. A plate aligner aligns the programming plate on the plate support over the opening with the second end of each test pin in alignment with the first end of the corresponding contact probe. A unit aligner aligns the unit under test over the first ends of the test pins. A vacuum chamber is formed intermediate the base and the unit under test. Means forming the vacuum chamber comprises a flexible and collapsible seal intermediate the mounting member and the base.

Loading the Abstract Image...

First Claim