System and method for obtaining compensated level measurements
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United States of America Patent
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-
Nov 25, 1980
Grant Date -
N/A
app pub date -
Dec 8, 1978
filing date -
Dec 8, 1978
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A compensated level measuring system is disclosed for measuring the level of the material housed in a vessel, the system incorporating compensation means for compensating for variations in the dielectric constant of the material. A two element measuring system is used, having a first element mounted at a fixed position within the vessel containing the material for obtaining a level signal which is a function of the material level, and a second element maintained within the vessel and always submerged in the material for obtaining a reference signal. Means are provided for adjusting the reference signal so that it can accurately compensate for variations in the level signal which occur independently of the material level. The compensating means is provided either by a mechanical embodiment in which the reference signal is effectively tuned by modifying the position of the reference probe, or electronic means where the effective reference signal is modified by an error function to compensate for errors introduced by changes in the dielectric constant of the material being measured.
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