Admittance sensing probe having multiple sensing elements
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United States of America Patent
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Jun 24, 1980
Grant Date -
N/A
app pub date -
Nov 24, 1978
filing date -
Nov 24, 1978
priority date (Note) -
Expired
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Abstract
A single, elongated admittance sensing probe element comprises an elongated probe structure including a conductive level measuring probe electrode and a conductive composition probe electrode longitudinally spaced from the level measuring probe electrode closer to one end of the probe. A conductive shield extends between the level measuring and composition probe elements and beyond the composition probe element at the end of the probe. The entire structure is enclosed within an insulating material. In one embodiment, a cylindrical ground electrode or shield is mounted around the probe structure.
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