MEASUREMENT METHOD AND APPARATUS

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United States of America

APP PUB NO 20250119669A1
SERIAL NO

18941978

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Abstract

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This application provides a measurement method and apparatus. The method includes: A first device obtains a kth first sensing result output by a first sensing neural network usable for a first sensing task, the kth first sensing result is determined based on measurement results of N measurement devices that are obtained through selection from M measurement devices for k times based on a selection neural network, 1≤k≤Nth first sensing result, where 1≤Lth first sensing result output by the first sensing neural network, where the (k+1)th first sensing result is determined based on measurement results of the N measurement devices and the L measurement devices.

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Patent Owner(s)

Patent OwnerAddress
HUAWEI TECHNOLOGIES CO LTDLONGGANG SHENZHEN GUANGDONG 518129

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HUANGFU, Yourui Hangzhou, CN 40 82
LI, Rong Boulogne Billancourt, FR 404 1020
WANG, Jian Hangzhou, CN 1906 17240

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